AEM, Imaging and Spectroscopy - AEMIS
JEOL JEM 2100 80-200kV - Transmission Electron Microscopy
FEI Helios NanoLab 450S Dual Beam - FIB with UHREM FEG-SEM - Scanning Electron Microscopy
FEI Quanta 650 FEG Environmental SEM (including Peltier and Heating Stage) - Scanning Electron Microscopy
Automated Critical Point Dryer Leica EM CPD300 - Sample Preparation for Electron Microscopy